CVE-2025-9709
8.6
CVSS:4.0/AV:P/AC:L/AT:N/PR:N/UI:N/VC:H/VI:H/VA:H/SC:H/SI:H/SA:H/S:P
Summary
On-Chip Debug and Test Interface With Improper Access Control and Improper Protection against Electromagnetic Fault Injection (EM-FI) in Nordic Semiconductor nRF52810 allow attacker to perform EM Fault Injection and bypass APPROTECT at runtime, requiring the least amount of modification to the hardware system possible.
Affected Software
| Vendor | Product | Version Range | Status |
|---|---|---|---|
| Nordic Semiconductor | nRF52810 | 0 | affected |
Weaknesses
- CWE-1191: CWE-1191: On-Chip Debug and Test Interface With Improper Access Control
- CWE-1319: CWE-1319: Improper Protection against Electromagnetic Fault Injection (EM-FI)
- Runtime Hardware Protection Bypass
ADP Enrichment
CISA ADP Vulnrichment
- SSVC:
- Exploitation: poc
- Automatable: no
- Technical Impact: total
References
- https://raelize.com/upload/research/2022/No_Hat_2022_-_Glitching_devices_for_code_execution_v1.1.pdf
- https://raelize.com/upload/research/2025/Dartmouth_202505_False-Injections-Tales-of-Physics-Misconceptions-and-Weird-Machines_v1.1.pdf
- https://nvd.nist.gov/vuln/detail/CVE-2020-27211
- https://www.toreon.com/cve-2025-9709-major-vulnerability-in-common-chip/
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