CVE-2024-53017

Summary

Memory corruption while handling test pattern generator IOCTL command.

Affected Software

VendorProductVersion RangeStatus
Qualcomm, Inc.SnapdragonSDM429Waffected
Qualcomm, Inc.SnapdragonSnapdragon 429 Mobile Platformaffected
Qualcomm, Inc.SnapdragonWCN3620affected
Qualcomm, Inc.SnapdragonWCN3660Baffected

Weaknesses

  • CWE-823: CWE-823 Use of Out-of-range Pointer Offset

ADP Enrichment

CISA ADP Vulnrichment

  • SSVC:
  • Exploitation: none
    • Automatable: no
    • Technical Impact: partial

References