CVE-2024-45573

Summary

Memory corruption may occour while generating test pattern due to negative indexing of display ID.

Affected Software

VendorProductVersion RangeStatus
Qualcomm, Inc.SnapdragonFastConnect 6700affected
Qualcomm, Inc.SnapdragonFastConnect 6900affected
Qualcomm, Inc.SnapdragonFastConnect 7800affected
Qualcomm, Inc.SnapdragonQCM5430affected
Qualcomm, Inc.SnapdragonQCM6490affected
Qualcomm, Inc.SnapdragonQCS5430affected
Qualcomm, Inc.SnapdragonQCS6490affected
Qualcomm, Inc.SnapdragonQualcomm Video Collaboration VC3 Platformaffected
Qualcomm, Inc.SnapdragonSC8380XPaffected
Qualcomm, Inc.SnapdragonSDM429Waffected
Qualcomm, Inc.SnapdragonSnapdragon 429 Mobile Platformaffected
Qualcomm, Inc.SnapdragonSnapdragon 7c+ Gen 3 Computeaffected
Qualcomm, Inc.SnapdragonSnapdragon 8cx Gen 3 Compute Platform (SC8280XP-AB, BB)affected
Qualcomm, Inc.SnapdragonWCD9370affected
Qualcomm, Inc.SnapdragonWCD9375affected
Qualcomm, Inc.SnapdragonWCD9380affected
Qualcomm, Inc.SnapdragonWCD9385affected
Qualcomm, Inc.SnapdragonWCN3620affected
Qualcomm, Inc.SnapdragonWCN3660Baffected
Qualcomm, Inc.SnapdragonWSA8830affected
Qualcomm, Inc.SnapdragonWSA8835affected
Qualcomm, Inc.SnapdragonWSA8840affected
Qualcomm, Inc.SnapdragonWSA8845affected
Qualcomm, Inc.SnapdragonWSA8845Haffected

Weaknesses

  • CWE-823: CWE-823 Use of Out-of-range Pointer Offset

ADP Enrichment

CISA ADP Vulnrichment

  • SSVC:
  • Exploitation: none
    • Automatable: no
    • Technical Impact: total

References