CVE-2023-28581
9.8
CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
Summary
Memory corruption in WLAN Firmware while parsing receieved GTK Keys in GTK KDE.
Affected Software
| Vendor | Product | Version Range | Status |
|---|---|---|---|
| Qualcomm, Inc. | Snapdragon | FastConnect 6800 | affected |
| Qualcomm, Inc. | Snapdragon | FastConnect 6900 | affected |
| Qualcomm, Inc. | Snapdragon | FastConnect 7800 | affected |
| Qualcomm, Inc. | Snapdragon | QCA6391 | affected |
| Qualcomm, Inc. | Snapdragon | QCA6426 | affected |
| Qualcomm, Inc. | Snapdragon | QCA6436 | affected |
| Qualcomm, Inc. | Snapdragon | SD 8 Gen1 5G | affected |
| Qualcomm, Inc. | Snapdragon | SD865 5G | affected |
| Qualcomm, Inc. | Snapdragon | Snapdragon 8 Gen 1 Mobile Platform | affected |
| Qualcomm, Inc. | Snapdragon | Snapdragon 865 5G Mobile Platform | affected |
| Qualcomm, Inc. | Snapdragon | Snapdragon 865+ 5G Mobile Platform (SM8250-AB) | affected |
| Qualcomm, Inc. | Snapdragon | Snapdragon 870 5G Mobile Platform (SM8250-AC) | affected |
| Qualcomm, Inc. | Snapdragon | Snapdragon AR2 Gen 1 Platform | affected |
| Qualcomm, Inc. | Snapdragon | Snapdragon XR2 5G Platform | affected |
| Qualcomm, Inc. | Snapdragon | SSG2115P | affected |
| Qualcomm, Inc. | Snapdragon | SSG2125P | affected |
| Qualcomm, Inc. | Snapdragon | SXR1230P | affected |
| Qualcomm, Inc. | Snapdragon | SXR2230P | affected |
| Qualcomm, Inc. | Snapdragon | WCD9380 | affected |
| Qualcomm, Inc. | Snapdragon | WCD9385 | affected |
| Qualcomm, Inc. | Snapdragon | WCN6740 | affected |
| Qualcomm, Inc. | Snapdragon | WSA8810 | affected |
| Qualcomm, Inc. | Snapdragon | WSA8815 | affected |
| Qualcomm, Inc. | Snapdragon | WSA8830 | affected |
| Qualcomm, Inc. | Snapdragon | WSA8832 | affected |
| Qualcomm, Inc. | Snapdragon | WSA8835 | affected |
Weaknesses
- CWE-119: CWE-119 Improper Restriction of Operations within the Bounds of a Memory Buffer
ADP Enrichment
CVE Program Container
Additional References
CISA ADP Vulnrichment
- SSVC:
- Exploitation: none
- Automatable: yes
- Technical Impact: total
References
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